q-tech corporation - 10150 w. jefferson boulevard, culver city 90232 - tel: 310-836-7900 - fax: 310-836-2157 - www.q-t e c h . c o m q-tech corporation table of contents specification control drawing scope scope part number applicable documents specifications and standards requirements general requirements design and construction outline dimensions and terminal connections package body and lead finish active devices performance requirements maximum ratings electrical performance characteristics and limits delta limits total dose radiation limits quality assurance provisions general screening tests frequency-temperature stability (tolerance) test method quality conformance inspection frequency-temperature stability test method packaging preservation, packaging and packing notes ordering information part number table i . stability/temperature options table ii. maximum ratings table iii. electrical performance characteristics figure. 1. package dimensions and terminal connections qt601s tcxo detail specification qt601s tcxo detail specification (revision -, october 2007)
10/2/07 initial release - approved date description revision revisions general release document. consult factory for current revision. 51774 a sheet 1 of 5 cage code size scale: none t.mitchell date released by rev. - drawing no. qt601s b.remtulla date checked by temperature compensated crysta l oscillator, class s, detail specification for e.jackson date prepared by unless otherwise specified, dimensions are in inches. tolerances: 3 place decimal = .005 2 place decimal = .02 1 place decimal = .1 fractions = 1/16 angles = 2 degrees q-tech corporation 10150 w. jefferson blvd. culver city, ca. 90232-3510 specification control drawing
1 scope 1.1 scope. this specification establishes the detail requirements for hybrid, hermetically sealed, cmos output temperature compensated crystal oscillators for use in space flight missions. 1.2 part number. the part number shall be as specified in table i herein. 2 applicable documents 2.1 specifications and standards. unless otherwise specified, the following documents shall be applicable to this specification to the extent specified herein. specifications 401-0298-017 h ybrid crystal oscillators, tcxo, class s, general specification for 3 requirements 3.1 general requirements. the individual item requirements shall be as specified in the general specification with the exceptions, modifications, and additions specified herein. 3.2 design and construction 3.2.1. outline dimensions and terminal connections. the outline dimensions and terminal connections shall be as shown in figure 1 and 2 herein. 3.2.2. package body and lead finish. the package body and lead finish shall be gold in accordance with mil-prf-38534. 3.2.3. active devices. for output frequencies greater than 10 mhz, the cmos micorcircuit used in this part shall be national semiconductor corporation (nsc) 54ac00 from a wafer proven to be radiation tolerant to 100 krad (si) total ionizing dose. this device is specified to be single event latchup free (see dssc smd 5962-87549) for let up to 93 mev-cm 2 /mg . for lower frequencies the cmos microcircuit shall be intersil corporation 54acs family, silicon on sapphire t echnology, from a wafer proven to be radiation to l erant to 300 krad (si). 3.3 performance requirements 3.3.1. maximum ratings. the maximum ratings shall be as specified in table ii herein. 3.3.2. electrical performance characteristics and limits. the electrical performance requirements and limits shall be in accordance with table iii. 3.3.3. delta limits. except for frequency aging (refer to table iii herein), delta limits shall be in accordance with the general specification. 3.3.4. total dose radiation limits. hybrid crystal oscillators supplied in accordance with this specification shall be capable of meeting the performance requirements after being exposed to 100 krad total dose radiation levels. 4 quality assurance provisions 4.1 general. the quality assurance provisions shall be in accordance with the general specification with the exceptions, modifications, and additions specified herein. 4.2 screening tests. the screening tests shall be in accordance with the general specification. 4.2.1. frequency-temperature stability (tolerance) test method. devices shall be trimmed via adjustment of external resistor to ground, pin 1, for frequency accuracy at t = 25 oc during pre burn-in and group a electrical test (prior to temperature sweep). value shall be recorded as part of the test data. table iii general release document. consult factory for current revision. q-tech corporation 10150 w. jefferson blvd. culver city, ca. 90232 specification: qt601s, rev - sheet 2 of 5
limit applies only for these two electrical tests, but data shall be recorded for interim and final electrical using the res istor value obtained during pre burn-in electrical test. 4.3 quality conformance inspection. quality conformance inspection sh all be in accordance with the general specification and as specified herein . 4.4 frequency-temperature stability test method. test limit shall apply with reference to room temperature only rather than nominal frequency for qci group c, subgroups 2 and 4. test data shall be recorded with reference to nominal frequency, however, using the external trim resistor value as determined during group a electrical test (prior to temperature sweep), if available, or else the nominal value (5 kohms). 5 packaging 5.1 preservation, packaging and packing. hybrid crystal oscillators shall be prepared for delivery in accordance with the general specification. 6 notes. 6.1 notes. the notes of the general specification are applicable to this drawing. 6.2 ordering information. the procuring activity shall advise q-tech corporation at the time of request for quotation if quality conformance insp ection is to be required. 6.2.1. part number. qt60 1 s a b m - 16.00000 mhz model # supply voltage: a: 5.0 volts; l: 3.3 volts temp stability - see table i screening: e: engineering model; m: flight model frequency (7 digits) 0.5 ppm, 0 c to +50 c e 1 ppm, -20 c to + 70 c d 1 ppm, -40 c to + 70 c c 1 ppm, -40 c to + 80 c b 2 ppm, -45 c to +85 c a temp stability option table i. stability / temperature options oc/w 50 qjc package thermal resistance oc/seconds 250/10 lead solder temperature/time oc 125 -65 tstg storage temperature oc 125 -55 t c operating temperature volts 5.25 0 v cc supply voltage, ?l? volts 5.65 0 v cc supply voltage, ?a? units max min symbol parameter table ii. maximum ratings general release document. consult factory for current revision. q-tech corporation 10150 w. jefferson blvd. culver city, ca. 90232 specification: qt601s, rev - sheet 3 of 5
10/ ppb/g 10 d f/f per g, all 3 axes vibration sensitivity 9/ ppm / volt -20 range: 0 - .5 volts frequency trim sensivitiy, tuning voltage 9/ ppb / ohm -1 nominal value = 5 kohms frequency trim sensivitiy, external resistor 8/ ppm 5 frequency adjustment range 7/ dbc -75 -105 -130 -140 -145 25 oc,@ sideband freq (hz): 10 100 1000 10000 100000 phase noise ms 10 startup time 6/ ppm 4.0 70 c 2 c frequency aging (after 5 years) ppm 0.4 70 c 2 c frequency aging (after 30 days) % 50 10 measured at vcc/2 duty cycle nsec 4 rise / fall time 5/ vdc 0.9xvcc output voltage - logic "1" 5/ vdc 0.1xvcc output voltage - logic "0" pf 15 load ma 25 10 - 32 ma 20 less than 10 frequency range, mhz input current ppm 0.2 10 % change in load load pulling ppm 0.2 for 5% change in vcc frequency voltage stability % + 5% -5% supply voltage (v cc) tolerance ppm 30 -55 oc, +90 oc frequency/temperature stability, extended range 1/, 2/ see table i frequency/temperature stability 3 to 32 mhz frequency range units max. nom. min. notes limits test conditions 3/,4/ electrical parameter table iii. electrical performance characteristics notes 1/ frequency/temperature stability (tolerance) is referenced to nominal output frequency and includes trimming with a 1% external resistor to ground, pin 1. required value shall be provided at the time of shipment. 2/ shall be measured using continuous temperature ramp (slew) from -50 oc to 90 oc followed by a ramp from 90 oc to -50 oc with end point dwell no greater than 1 hour. temperature rate shall be no greater than 0.5c per minute with readings recorded in increments no greater than 0.3c. test data shall be plotted to show thermal hysteresis. 3/ unless otherwise specified, the limits are over the full operating temperature range, under specified load conditions and nominal supply voltage. 4/ unless otherwise specified, all measurements are in accordance with mil-prf-55310. 5/ voltage values are with respect to network ground terminal. 6/ based on extrapolation of 30 day aging data using logarithmic curve fitting. 7/ temperature limits are -45 oc and +85 oc 8/ guaranteed by design, not tested. range shall be sufficient to remove frequency drift that incurred during screening. 9/ value shown is for supply voltage ?a?; sensitivity shall be nominally -2 ppb/ohm and -40 ppm/volt for ?l? supply voltage option. 10/ guaranteed by design, not a screening limit. general release document. consult factory for current revision. q-tech corporation 10150 w. jefferson blvd. culver city, ca. 90232 specification: qt601s, rev - sheet 4 of 5
notes: 1.) dimensions are in inches. 2.) lead numbers are for reference only and are not marked on the unit. 3.) a triangle symbol is marked on the corne r of the package to indicate pin 1. 4.) all pins with function nc and/or itp may not be connected as external tie or connections. nc 14 - 32 vcc 13 output 12 vcc 11 nc 6 - 10 ground/case 5 external frequency adjust 4 nc 1 - 3 desi gnation pin no. figure 1. package dimensions and terminal connections general release document. consult factory for current revision. q-tech corporation 10150 w. jefferson blvd. culver city, ca. 90232 specification: qt601s, rev - sheet 5 of 5
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